TrailBlaze™ is Mobile/Nordic’s instance generation, memory compiler , memory development, auto characterization and BIST compiler software.
Instance Generation
Mobile Semiconductor’s Trailblaze™ software delivers silicon-proven memory IP solutions that set the standard in high performance and low voltage embedded SRAMs. Using standard or custom foundry bit cells, Trailblaze™ does the following:
- Low voltage, ultra high speed and high density architectures
- Multiple mux options per compiler to enable various aspect ratios
- 1-bit granularity on word widths to allow for block size optimizations
- Bit Write with Global Write Enable
- Byte Write
- Column Redundancy and Repair
Compiler Modificaton and Auto Recharacterizaton
Software enables customers to update, modify, recharacterize memory compilers as needed.
BIST
Powerful Built in Self Test module for Mobile Semi Memory Compilers.
The Trailblaze™ Built-in Self Test (BIST) Compiler provides seamless integration to verify Mobile Semiconductor’s optimized memory solutions. The configurable Trailblaze™ BIST performs at-speed testing of Trailblaze™ generated embedded SRAMs.
Programmable March algorithms included in the Trailblaze™ BIST give extensive test coverage and diagnostic capabilities provide multiple options to isolate defects.
The Trailblaze™ BIST Compiler generates a synthesizable Verilog RTL IP module as well as a top-level Verilog module to instantiate both the Trailblaze™ BIST and the Mobile Semiconductor embedded SRAM instance. Synthesis scripts are provided for enhanced design flow support.
MSC BIST Supports the New IJTAG Standard
IJTAG, the short form for “Internal JTAG”, refers to the upcoming IEEE 1687 standard. The current official title of this new standard is the IEEE P1687 Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device.